Overview of Microscopy Techniques
Atomic Force Microscopy
Spin–Spin Coupling: Three-Bond Coupling (Vicinal Coupling)
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Updated: Apr 1, 2026

Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
Published on: September 28, 2016
Nadine Hauptmann1, César González, Fabian Mohn
1Institut für Experimentelle und Angewandte Physik, Christian-Albrechts-Universität zu Kiel, D-24098 Kiel, Germany. Institute for Molecules and Materials, Radboud University, 6500 GL Nijmegen, The Netherlands.
Scanning tunneling and atomic force microscopy reveal complex intramolecular contrasts of C60 molecules on Cu(111). Maximal attractive forces occur when [6,6] bonds align, confirmed by density functional theory.
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