Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

4.7K
Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
4.7K

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Integration of InP membranes with embedded InGaAs quantum wells on silicon-on-insulator by tunnel epitaxy.

Nanotechnology·2026
Same author

Controlled Synthesis of Copper Sulfide Nanoparticles in Oxygen-Deficient Conditions Using Flame Spray Pyrolysis (FSP) and Its Potential Application.

Small (Weinheim an der Bergstrasse, Germany)·2025
Same author

Characterization of structure and mixing in nanoparticle hetero-aggregates using convolutional neural networks: 3D-reconstruction versus 2D-projection.

Ultramicroscopy·2024
Same author

Synergizing ICP-MS, STEM-EDXS, and SMPS single particle analytics exemplified by superlattice L1<sub>0</sub> Pt/Fe aerosol nanoparticles produced by spark ablation.

Nanoscale advances·2024
Same author

Tuning the morphology and chemical distribution of Ag atoms in Au rich nanoparticles using electrochemical dealloying.

Nanoscale·2024
Same author

GaN atomic electric fields from a segmented STEM detector: Experiment and simulation.

Journal of microscopy·2024

Related Experiment Video

Updated: Mar 31, 2026

Picometer-Precision Atomic Position Tracking through Electron Microscopy
15:04

Picometer-Precision Atomic Position Tracking through Electron Microscopy

Published on: July 3, 2021

8.5K

Sample tilt effects on atom column position determination in ABF-STEM imaging.

Dan Zhou1, Knut Müller-Caspary2, Wilfried Sigle1

  • 1Max Planck Institute for Solid State Research, Stuttgart Center for Electron Microscopy, Heisenbergstrasse 1, 70569 Stuttgart, Germany.

Ultramicroscopy
|October 20, 2015
PubMed
Summary
This summary is machine-generated.

Annular bright-field (ABF) imaging is sensitive to electron beam tilt, affecting atom position determination. This study quantifies this effect for accurate crystal defect analysis using transmission electron microscopy.

Keywords:
Annular bright-field imagingAtom position determinationImage simulationSample tilt

More Related Videos

Cryo-Electron Tomography Remote Data Collection and Subtomogram Averaging
08:55

Cryo-Electron Tomography Remote Data Collection and Subtomogram Averaging

Published on: July 12, 2022

6.1K
AMEBaS: Automatic Midline Extraction and Background Subtraction of Ratiometric Fluorescence Time-Lapses of Polarized Single Cells
06:03

AMEBaS: Automatic Midline Extraction and Background Subtraction of Ratiometric Fluorescence Time-Lapses of Polarized Single Cells

Published on: June 23, 2023

907

Related Experiment Videos

Last Updated: Mar 31, 2026

Picometer-Precision Atomic Position Tracking through Electron Microscopy
15:04

Picometer-Precision Atomic Position Tracking through Electron Microscopy

Published on: July 3, 2021

8.5K
Cryo-Electron Tomography Remote Data Collection and Subtomogram Averaging
08:55

Cryo-Electron Tomography Remote Data Collection and Subtomogram Averaging

Published on: July 12, 2022

6.1K
AMEBaS: Automatic Midline Extraction and Background Subtraction of Ratiometric Fluorescence Time-Lapses of Polarized Single Cells
06:03

AMEBaS: Automatic Midline Extraction and Background Subtraction of Ratiometric Fluorescence Time-Lapses of Polarized Single Cells

Published on: June 23, 2023

907

Area of Science:

  • Materials Science
  • Solid State Physics
  • Electron Microscopy

Background:

  • Atomically resolved transmission electron microscopy is crucial for analyzing crystal defects and strain.
  • Annular bright-field (ABF) imaging is a popular technique for mapping light and heavy elements.
  • ABF contrast formation depends on electron wave phase, making it sensitive to beam tilt.

Purpose of the Study:

  • To experimentally demonstrate and quantify the sensitivity of ABF imaging to electron beam tilt.
  • To provide a basis for error estimation in quantitative ABF studies.

Main Methods:

  • Experimental measurement of ABF imaging sensitivity to beam tilt.
  • Image simulations to quantify the observed effects.

Main Results:

  • ABF imaging exhibits significant sensitivity to the tilt of the electron beam relative to the crystal zone axis.
  • This sensitivity is more pronounced compared to high-angle annular dark-field imaging.

Conclusions:

  • Understanding and quantifying beam tilt sensitivity is essential for accurate quantitative ABF analysis.
  • This work provides critical data for improving the reliability of atom position determination in materials science.