Analysis and Correction of Dynamic Geometric Misalignment for Nano-Scale Computed Tomography at BSRF

Due to its high spatial resolution, synchrotron radiation x-ray nano-scale computed tomography (nano-CT) is sensitive to misalignments in scanning geometry, which occurs quite frequently because of mechanical errors in manufacturing and assembly or from thermal expansion during the time-consuming scanning. Misalignments degrade the imaging results by imposing artifacts on the nano-CT slices. In this paper, the geometric misalignment of the synchrotron radiation nano-CT has been analyzed by partial derivatives on the CT reconstruction algorithm and a correction method, based on cross correlation and least-square sinusoidal fitting, has been reported. This work comprises a numerical study of the method and its experimental verification using a dataset measured with the full-field transmission x-ray microscope nano-CT at the beamline 4W1A of the Beijing Synchrotron Radiation Facility. The numerical and experimental results have demonstrated the validity of the proposed approach. It can be applied for dynamic geometric misalignment and needs neither phantom nor additional correction scanning. We expect that this method will simplify the experimental operation of synchrotron radiation nano-CT.