Atomic Force Microscopy
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Updated: Mar 31, 2026

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid
Published on: December 2, 2022
Rui Li1,2, Hongfei Ye1, Weisheng Zhang1
1State Key Laboratory of Structural Analysis for Industrial Equipment, Department of Engineering Mechanics, Dalian University of Technology, Dalian 116024, China.
Accurate atomic force microscope (AFM) cantilever spring constant calibration is improved using thin plate theory. This new model reveals 3D and Poisson effects are crucial for precise force measurements.
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