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Preparation of Samples for Electron Microscopy01:20

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To be visualized by an electron microscope, either transmission or scanning, biological samples need to be fixed (stabilized) so the electron beam does not destroy them and dried thoroughly (desiccated/dehydrated) so the vacuum does not affect them. Fixation needs to be done as quickly as possible because the sample properties will start changing as soon as it is removed from its natural environment. For example, in a tissue sample, the oxygen levels begin decreasing, causing an altered...
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Two basic types of preparation are used to visualize specimens with a light microscope: wet mounts and fixed specimens.
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EDTA titrations may necessitate masking and demasking agents to temporarily protect a particular metal ion in a mixture from the EDTA reaction. These agents facilitate the sequential analysis of the metal ions by forming stable complexes with some—but not all—metal ions during certain steps.
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A simple approach to atom probe sample preparation by using shadow masks.

Peter Felfer1, Ingrid McCarroll1, Chandra Macauley2

  • 1Australian Centre for Microscopy and Microanalysis, The University of Sydney, 2006, Australia.

Ultramicroscopy
|November 2, 2015
PubMed
Summary

A new shadow mask method prepares atom probe samples for non-conductors and layered materials. This technique bypasses focused ion beam (FIB) lift-out, improving throughput and reducing preparation complexity.

Keywords:
Atom probe tomographyBroad ion beamFocused ion beamSample preparation

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Area of Science:

  • Materials Science
  • Analytical Chemistry
  • Surface Science

Background:

  • Atom probe tomography (APT) requires precisely prepared samples.
  • Conventional methods, often involving focused ion beam (FIB) milling, are time-consuming and challenging for non-conductive or layered materials.
  • Existing techniques can struggle with surface layers like oxides or thin films.

Purpose of the Study:

  • To introduce a novel, simplified method for preparing atom probe samples.
  • To demonstrate the efficacy of this method for challenging material types.
  • To reduce the time and complexity associated with atom probe sample preparation.

Main Methods:

  • Utilisation of shadow masks within a broad ion beam system.
  • Direct preparation of atom probe tips without a FIB lift-out step.
  • Application to non-conductive materials and those with surface layers (e.g., oxides, implanted layers, thin films).

Main Results:

  • Successful preparation of atom probe samples using the shadow mask broad ion beam technique.
  • Demonstrated suitability for a range of materials, including insulators and layered structures.
  • Significant reduction in sample preparation time and complexity compared to traditional FIB methods.

Conclusions:

  • The shadow mask broad ion beam method offers a streamlined approach to atom probe sample preparation.
  • This technique enhances throughput and accessibility for analyzing challenging materials.
  • It represents a significant advancement in preparing samples for atom probe analysis.