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Updated: Mar 30, 2026

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
Published on: June 19, 2018
Non-Sequential Spectral Acquisitions and Data Reconstruction to Remove Time-Dependent Effects from X-Ray Spectra
Phillip Gopon1, Peter Sobol, John Fournelle
1Department of Geoscience, University of Wisconsin 1215 W. Dayton St., Madison, Wisconsin 53706 USA.
Prolonged electron beam exposure in X-ray spectroscopy can alter sample spectra due to hydrocarbon contamination. Researchers developed methods to remove these time-dependent artifacts, improving spectral accuracy for low-voltage X-rays.
Area of Science:
- Materials Science
- Analytical Chemistry
- Physics
Background:
- X-ray spectroscopy often requires extended sample exposure to electron beams for signal generation.
- Conventional methods involve systematic parameter variation, which can be time-consuming and introduce artifacts.
- Prolonged electron beam exposure can lead to sample degradation and spectral changes, particularly from hydrocarbon contamination.
Purpose of the Study:
- To investigate the impact of hydrocarbon contamination on X-ray spectra generated by electron beam exposure.
- To develop and present methods for mitigating time-dependent artifacts in low-voltage X-ray spectroscopy.
- To provide freely available software for artifact removal.
Main Methods:
- Utilized X-ray spectroscopy techniques requiring electron beam interaction with samples.
- Systematically varied experimental parameters to acquire spectral data.
- Developed and applied novel methods to identify and remove hydrocarbon contamination and other time-dependent artifacts.
Main Results:
- Demonstrated that hydrocarbon contamination significantly affects X-ray spectra.
- Successfully implemented methods to remove time-dependent artifacts from spectral data.
- Confirmed the utility of these methods for low-voltage X-ray analysis.
Conclusions:
- Hydrocarbon contamination is a critical factor affecting spectral fidelity in electron beam X-ray spectroscopy.
- The presented methods effectively correct for beam-induced artifacts, enhancing spectral accuracy.
- Freely accessible software is provided to facilitate the application of these correction techniques by researchers.
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