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Updated: Mar 30, 2026

Characterizing Far-infrared Laser Emissions and the Measurement of Their Frequencies
Published on: December 18, 2015
Frequency stability of a wavelength meter and applications to laser frequency stabilization
Abstract:
Interferometric wavelength meters have attained frequency resolutions down to the megahertz range. In particular, Fizeau interferometers, which have no moving parts, are becoming a popular tool for laser characterization and stabilization. In this paper, we characterize such a wavelength meter using an ultrastable laser in terms of relative frequency instability σ(y)(τ) and demonstrate that it can achieve a short-term instability σ(y)(1s)≈2×10(-10) and a frequency drift of order 10 MHz/day. We use this apparatus to demonstrate frequency control of a near-infrared laser, where a frequency instability below 3×10(-10) from 1 to 2000 s is achieved. Such performance is, for example, adequate for ion trapping and atom cooling experiments.
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