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Mode Specific Backscattering in a Quantum Point Contact.

A A Kozikov1, R Steinacher1, C Rössler1

  • 1Solid State Physics Laboratory, ETH Zürich , CH-8093 Zürich, Switzerland.

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|November 17, 2015
PubMed
Summary
This summary is machine-generated.

We developed a new scanning gate grid technique to measure quantum point contact (QPC) conductance. This method reveals interference fringes alongside distorted QPC plateaus, allowing spatial resolution of mode structures.

Keywords:
GaAsScanning gate microscopyballistic transportquantum point contact

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Area of Science:

  • * Condensed matter physics
  • * Quantum electronics

Background:

  • * Quantum point contacts (QPCs) are crucial components in quantum devices.
  • * Conventional scanning gate microscopy has limitations in probing localized electronic phenomena.

Purpose of the Study:

  • * To introduce and validate a scanning gate grid measurement technique.
  • * To investigate the influence of a scanning tip on QPC conductance plateaus.
  • * To spatially resolve the mode structure of QPCs under tip influence.

Main Methods:

  • * Measuring QPC conductance as a function of gate voltage at discrete tip positions.
  • * Compensating for the capacitive coupling between the scanning tip and the QPC.
  • * Utilizing a grid-based approach for detailed spatial mapping.

Main Results:

  • * The technique successfully probes QPC conductance plateaus affected by the scanning tip.
  • * Interference fringes were observed to coexist with distorted QPC conductance plateaus.
  • * The spatial mode structure associated with each plateau was resolved.

Conclusions:

  • * The scanning gate grid technique offers enhanced capabilities for probing quantum electronic devices.
  • * The coexistence of interference fringes and distorted plateaus provides new insights into tip-sample interactions.
  • * This method enables detailed spatial characterization of electronic modes within QPCs.