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Ionic screening effect on low-frequency drain current fluctuations in liquid-gated nanowire FETs
Ming-Pei Lu1, Eric Vire, Laurent Montès
1National Nano Device Laboratories, National Applied Research Laboratories, Hsinchu 300, Taiwan.
Ionic screening significantly impacts liquid-semiconductor interfaces. Higher ionic strength in buffers reduces low-frequency noise in nanowire field-effect transistors (FETs), crucial for bioelectronic applications.
Area of Science:
- Surface science
- Semiconductor physics
- Nanotechnology
Background:
- The ionic screening effect is critical for understanding liquid-semiconductor interfaces.
- Low-frequency noise in nanowire (NW) field-effect transistors (FETs) is influenced by surface properties.
- Investigating noise characteristics provides insight into ionic screening mechanisms.
Purpose of the Study:
- To investigate the impact of ionic screening on low-frequency drain current noise in liquid-gated NW FETs.
- To elucidate the physical mechanisms behind ionic screening effects on current fluctuations.
- To develop a noise model for liquid-gated NW FET systems.
Main Methods:
- Fabrication and characterization of liquid-gated NW FETs.
- Measurement of low-frequency drain current noise under varying ionic strengths of electrolyte buffers.
- Development of a theoretical noise model incorporating charge coupling efficiency.
Main Results:
- Low-frequency noise magnitude decreased with increasing ionic strength of the buffer.
- A 70% reduction in noise was observed when transitioning from 0.001 M to 0.1 M ionic strength buffer.
- A noise model was proposed to explain the observed ionic screening effects.
Conclusions:
- Ionic screening in electrolyte buffers significantly modulates low-frequency noise in liquid-gated NW FETs.
- The proposed noise model accurately describes the influence of ionic screening on current fluctuations.
- Findings offer valuable insights for developing NW FETs for bioelectronics, nanosensors, and hybrid nanoelectronics.
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