Electrical contacts to two-dimensional semiconductors

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Updated: Mar 30, 2026

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
08:12

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures

Published on: December 5, 2015

12.9K

Adrien Allain1, Jiahao Kang2, Kaustav Banerjee2

  • 1Electrical Engineering Institute, École Polytechnique Fédérale de Lausanne, CH-1015 Lausanne, Switzerland.

Nature Materials
|November 21, 2015
PubMed

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