Metal-Semiconductor Junctions
Semiconductors
Types of Semiconductors
Biasing of Metal-Semiconductor Junctions
Fermi Level Dynamics
Schottky Barrier Diode
You might also read
Articles linked to this work by shared authors, journal, and citation graph.
Updated: Mar 30, 2026

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
Adrien Allain1, Jiahao Kang2, Kaustav Banerjee2
1Electrical Engineering Institute, École Polytechnique Fédérale de Lausanne, CH-1015 Lausanne, Switzerland.
Optimizing electrical contacts is crucial for high-performance two-dimensional (2D) electronic and optoelectronic devices. This study reviews the physics of 2D material interfaces and progress in achieving efficient contacts and spin injection.
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: