Temperature-Dependent Evolution of Poly(3-Hexylthiophene) Type-II Phase in a Blended Thin Film

The structure of P3HT in P3HT:PCBM films is examined on a poly(3,4-ethylenedioxythiophene) polystyrene sulfonate (

PSS) substrate subjected to cryo-cooling to low temperature (-143 °C) followed by gradual heating to 50 °C. The behavior of these systems is examined in the absence and presence of an Al electrode on top of the P3HT:PCBM film. At temperatures below -10 °C, only the type-I phase of P3HT is observed. However, the type-II phase of P3HT starts to form near -10 °C, in both the presence and absence of the Al layer. In the system without an Al layer, the type-II phase disappears at 30 °C, but this phase persists to 50 °C in the presence of the Al layer. Concomitant with the formation of the type-II phase, a 1:3 ordered P3HT type-II (1/3,0,0) superlattice peak emerged. The type-II domains tend to form near the Al electrode layer and show a higher degree of alignment than the type-I crystals.