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Updated: Mar 29, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
Silicon nanocrystal growth under irradiation of electron beam
Wei-Qi Huang1, Shi-Rong Liu2, Zhong-Mei Huang3
1Institute of Nanophotonic Physics, Guizhou University, Guiyang 550025 (China).
Abstract:
In our experiment, it was observed that silicon nanocrystal rapidly grows with irradiation of electron beam on amorphous silicon film prepared by pulsed laser deposition, and shape of silicon nanocrystal is usually sphere in smaller nanoscale with less exposure time under electron beam, in which the quantum dots are prepared in nanoscale near 3 nm. In the electron interaction process, it was investigated that the various crystals structures in different orientations occur in the same time and the condensed structures of silicon nanocrystal are changed with different impurity atoms in silicon film.
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