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Updated: Mar 29, 2026
Determining the Mechanical Strength of Ultra-Fine-Grained Metals
Published on: November 22, 2021
Determination of Mean Inner Potential and Inelastic Mean Free Path of ZnTe Using Off-Axis Electron Holography and
Zhaofeng Gan1, Michael DiNezza2, Yong-Hang Zhang2
11Department of Physics,Arizona State University,Tempe,AZ 85287,USA.
Abstract:
The mean inner potential (MIP) and inelastic mean free path (IMFP) of undoped ZnTe are determined using a combination of off-axis electron holography and convergent beam electron diffraction. The ZnTe MIP is measured to be 13.7±0.6 V, agreeing with previously reported simulations, and the IMFP at 200 keV is determined to be 46±2 nm for a collection angle of 0.75 mrad. Dynamical effects affecting holographic phase imaging as a function of incident beam direction for several common semiconductors are systematically studied and compared using Bloch wave simulations. These simulation results emphasize the need for careful choice of specimen orientation when carrying out quantitative electron holography studies in order to avoid erroneous phase measurements.
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