Updated: Mar 29, 2026

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
B Mayer1, L Janker1, B Loitsch1
1Walter Schottky Institut and Physik Department, Technische Universität München , Am Coulombwall 4, Garching 85748, Germany.
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