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Updated: Mar 29, 2026

Energy Dispersive X-ray Tomography for 3D Elemental Mapping of Individual Nanoparticles
Published on: July 5, 2016
A new method to measure electron density and effective atomic number using dual-energy CT images
Luis Isaac Ramos Garcia1, José Fernando Pérez Azorin2, Julio F Almansa3
1Department of Oncology, Clínica Universidad de Navarra, University of Navarra, Av Pio XII s/n, Pamplona, Navarre, Spain.
Abstract:
The purpose of this work is to present a new method to extract the electron density ([Formula: see text]) and the effective atomic number (Z eff) from dual-energy CT images, based on a Karhunen-Loeve expansion (KLE) of the atomic cross section per electron. This method was used to calibrate a Siemens Definition CT using the CIRS phantom. The predicted electron density and effective atomic number using 80 kVp and 140 kVp were compared with a calibration phantom and an independent set of samples. The mean absolute deviations between the theoretical and calculated values for all the samples were 1.7 % ± 0.1 % for [Formula: see text] and 4.1 % ± 0.3 % for Z eff. Finally, these results were compared with other stoichiometric method. The application of the KLE to represent the atomic cross section per electron is a promising method for calculating [Formula: see text] and Z eff using dual-energy CT images.
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