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Speckle Suppression by Decoherence in Fluctuation Electron Microscopy.

Aram Rezikyan1, Zechariah J Jibben2, Bryan A Rock1

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Summary
This summary is machine-generated.

Electron beam interactions cause decoherence, reducing speckle intensity variance in amorphous materials. This finding explains discrepancies in electron diffraction studies and impacts quantitative imaging techniques.

Keywords:
Fluctuation electron microscopyamorphous materialscontinuous random networkdecoherencemedium-range order

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Area of Science:

  • Materials Science
  • Condensed Matter Physics
  • Electron Microscopy

Background:

  • Quantitative electron diffraction studies often show discrepancies with theoretical predictions.
  • Experimental speckle intensity variance in fluctuation electron microscopy (FEM) is lower than expected.
  • The Stobbs factor in high-resolution electron microscopy suggests anomalous image intensities.

Purpose of the Study:

  • To compare experimental FEM speckle data with electron diffraction simulations.
  • To investigate the cause of reduced speckle intensity variance in amorphous materials.
  • To resolve discrepancies in electron diffraction studies and understand imaging anomalies.

Main Methods:

  • Experimental fluctuation electron microscopy (FEM) on amorphous carbon and silicon.
  • Electron diffraction simulations using kinematical scattering theory.
  • Modeling incorporating displacement decoherence and multiple scattering.

Main Results:

  • Experimental speckle intensity variance was over an order of magnitude lower than predicted by kinematical theory.
  • Decoherence, particularly displacement decoherence, was identified as the cause of speckle suppression.
  • The continuous random network model, with decoherence and multiple scattering, explained experimental variance data for amorphous silicon.

Conclusions:

  • Decoherence, driven by beam-induced structural rearrangements, significantly impacts electron diffraction speckle.
  • This decoherence mechanism reconciles discrepancies between X-ray and electron diffraction studies.
  • Decoherence likely affects all quantitative electron imaging and diffraction, including the Stobbs factor.