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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Related Experiment Video

Updated: Mar 28, 2026

Preparation and Friction Force Microscopy Measurements of Immiscible, Opposing Polymer Brushes

Preparation and Friction Force Microscopy Measurements of Immiscible, Opposing Polymer Brushes

Published on: December 24, 2014

Lateral Deformability of Polymer Brushes by AFM-Based Method

Shivaprakash N Ramakrishna¹, Edmondo M Benetti²

¹Laboratory for Surface Science and Technology (LSST), Department of Materials, ETH Zürich, Vladimir-Prelog-Weg 5, CH-8093 Zürich, Switzerland.

|December 17, 2015

Summary

No abstract available in PubMed .

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Last Updated: Mar 28, 2026

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