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Related Experiment Videos

[Time-Resolved XEOL Experiment System on BL14W1 at SSRF].

Zhao-hong Zhang, Zheng Jiang, Song Xue

Guang Pu Xue Yu Guang Pu Fen Xi = Guang Pu

|December 18, 2015

Summary

A new time-resolved X-ray excited optical luminescence (TRXEOL) system was developed at SSRF for advanced materials analysis. This system achieves high time resolution, enabling deeper understanding of luminescence behaviors and electronic structures.

Related Experiment Videos

Area of Science:

Materials Science
Spectroscopy
Synchrotron Radiation

Context:

The Shanghai Synchrotron Radiation Facility (SSRF) has developed a novel time-resolved X-ray excited optical luminescence (TRXEOL) experimental system.
This system integrates timing, spectrometer, and nuclear instrument modules for precise luminescence measurements.
It leverages synchrotron X-ray pulses and storage ring time structures for time-correlated single photon counting.

Purpose:

To develop and implement a TRXEOL system for time-resolved optical luminescence studies at SSRF.
To achieve high timing resolution (picosecond scale) for detailed analysis of luminescence dynamics.
To enable combined optical and X-ray absorption fine structure spectroscopy (XAFS) for comprehensive material characterization.

Summary:

The developed TRXEOL system utilizes a self-developed timing system with 6 ps jitter and 5 ps resolution.
Key components include Constant Fraction Discriminator, Time to Amplitude Converter, and Multi-Channel Analyzer for accurate data acquisition.
The system demonstrated a time resolution of less than 1 ns, successfully analyzing ZnO nanowire luminescence decay and spectra.

Impact:

Enables in-depth investigation of luminescence behaviors and electronic structures through time-resolved optical and XAFS measurements.
Provides a feasible and reliable platform for time-resolved techniques at synchrotron facilities.
Advances the capabilities of the SSRF XAFS beamline for complex material analysis.