Simultaneous Scanning Ion Conductance Microscopy and Atomic Force Microscopy with Microchanneled Cantilevers

Area of Science:

• Nanotechnology
• Biophysics
• Materials Science

Background:

• Simultaneous imaging techniques are crucial for understanding nanoscale phenomena.
• Integrating Scanning Ion Conductance Microscopy (SICM) and Atomic Force Microscopy (AFM) presents technical challenges.
• Advanced microscopy is needed for high-resolution biological sample analysis.

Purpose of the Study:

• To develop a hybrid SICM-AFM system for concurrent measurements.
• To validate the probe's contact point in SICM mode.
• To explore dual-feedback control for enhanced imaging stability.

Main Methods:

• Fabrication of AFM cantilevers with integrated microchannels for SICM.
• Simultaneous measurement of ionic current (SICM) and cantilever deflection (AFM).
• Quantitative comparison of SICM and AFM contact points using approach curves and calibration grids.
• Finite element simulations for data rationalization.

Main Results:

• Successful integration of SICM and AFM functionalities into a single platform.
• Accurate determination of the SICM probe's contact point on the sample surface.
• Demonstration of neurite network imaging with the hybrid system.
• Feasibility assessment of a dual-feedback controller using both ionic current and deflection signals.

Conclusions:

• The developed hybrid SICM-AFM tool offers simultaneous, high-resolution imaging capabilities.
• Precise contact point determination enhances SICM accuracy.
• The dual-feedback control system shows promise for advanced microscopy applications.
• This integrated approach provides a powerful platform for nanoscale investigations in biology and materials science.