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X-ray characterization of a multichannel smart-pixel array detector.

Steve Ross¹, Michael Haji-Sheikh¹, Andrew Huntington²

¹Northern Illinois University, Department of Electrical Engineering, DeKalb, IL 60115, USA.

Journal of Synchrotron Radiation

|December 25, 2015

Summary

This summary is machine-generated.

The Voxtel VX-798 X-ray pixel array detector (PAD) demonstrates selective X-ray counting with high energy and time resolution. This smart-pixel technology enables advanced synchrotron X-ray measurements.

Keywords:

CMOS ASIC X-ray detector pixel array detector

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Area of Science:

Materials Science
Instrumentation
Physics

Background:

The development of advanced X-ray detectors is crucial for high-resolution scientific imaging and spectroscopy.
Existing detectors often face limitations in energy resolution, time resolution, or count rate capabilities.

Purpose of the Study:

To present the first synchrotron X-ray characterization of the Voxtel VX-798 prototype X-ray pixel array detector (PAD).
To demonstrate the detector's capability for selective X-ray counting with precise energy and time windowing.
To evaluate the detector's performance for advanced synchrotron-based measurements.

Main Methods:

Characterization of the 48x48 pixel silicon PAD coupled to a CMOS readout ASIC using synchrotron X-rays.
Testing of individual X-ray counting within defined time windows and energy ranges.
Measurement of energy resolution, gating time, linearity, and spatial resolution (line and point spread functions).

Main Results:

The detector achieved a 60 ns gating time and 700 eV energy resolution, matching design parameters.
Demonstrated selective X-ray counting per pixel with programmable energy and time windows.
Linearity followed an isolated dead-time model, suggesting potential for megahertz count rates.
Negligible spatial blurring was observed, and picosecond time-resolved measurements were achieved.

Conclusions:

The Voxtel VX-798 PAD is a high-performance detector suitable for advanced synchrotron applications.
Its smart-pixel technology allows software optimization of energy and time resolution.
The detector is capable of performing picosecond time-resolved X-ray diffraction and fluorescence spectroscopy.