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Low Pressure Vapor-assisted Solution Process for Tunable Band Gap Pinhole-free Methylammonium Lead Halide Perovskite Films
Published on: September 8, 2017
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Dispersion relation data for methylammonium lead triiodide perovskite deposited on a (100) silicon wafer using a
Laurie J Phillips1, Atef M Rashed1, Robert E Treharne1
1Stephenson Institute for Renewable Energy, University of Liverpool, Liverpool L69 7ZF, UK.
Data in Brief
|December 25, 2015
Abstract:
Ellipsometry was used to measure the amplitude ratio and phase difference of light undergoing a phase shift as it interacts with a thin film of organic-inorganic hybrid perovskite CH3NH3PbI3 (MAPI) deposited onto a (100) silicon wafer. The refractive index and extinction coefficient was extracted from a multi-oscillator model fit to the ellipsometry data, as a function of wavelength, from 300 to 1500 nm.
