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Updated: Mar 28, 2026

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
The NSLS 100 element solid state array detector
L R Furenlid1, H W Kraner2, L C Rogers2
1National Synchrotron Light Source, Brookhaven National Laboratory, Upton, NY 11973, USA.
Next-generation X-ray absorption spectroscopy demands faster detectors. A new 100-element silicon (Si) array detector significantly increases count rates for trace element measurements, overcoming current limitations.
Area of Science:
- Materials Science
- Analytical Chemistry
- Instrumentation
Background:
- X-ray absorption studies of dilute samples rely on fluorescence detection.
- Solid-state detectors are crucial for trace element analysis due to their ability to differentiate fluorescence from scattered photons.
- Current 13-element germanium (Ge) array detectors are nearing saturation at high-brightness synchrotron sources.
Purpose of the Study:
- To design and develop a next-generation detector with significantly higher count rates for X-ray absorption spectroscopy.
- To address the limitations of current detectors in handling high photon fluxes from advanced synchrotron sources.
Main Methods:
- Development of a 100-element silicon (Si) array detector in a 10x10 matrix configuration.
- Utilizing ultrahigh purity silicon and a liquid nitrogen dewar assembly.
- Employing charge-sensitive preamplifiers, shaping amplifiers, single-channel analyzers, and scalers for signal processing.
- Implementing a comprehensive electronic system for diagnostics and calibration, controlled by LabView software.
Main Results:
- The 100-element Si array detector is designed to achieve substantially higher total count rates compared to existing detectors.
- The detector incorporates advanced electronics for precise signal processing and channel calibration.
- The instrument is controlled via LabView software, facilitating data collection and beamline integration.
Conclusions:
- The developed 100-element Si array detector represents a significant advancement for X-ray absorption spectroscopy.
- This new instrument will enable more efficient and sensitive trace element measurements at high-brightness synchrotron facilities.
- The detector design overcomes current technological bottlenecks, paving the way for future research.
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