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W Li1, L Urbanski1, M C Marconi1
1Electrical and Computer Engineering Department and NSF Engineering Research Center for Extreme Ultraviolet Science and Technology, Colorado State University, Fort Collins, Colorado 80523, USA.
Compact extreme ultraviolet (EUV) lasers enable advanced lithography. This review details a tabletop EUV system using Talbot imaging to reliably print defect-free, sub-50 nm features for diverse applications.
07:39Determination of the Excitation and Coupling Rates Between Light Emitters and Surface Plasmon Polaritons
Published on: July 21, 2018
10:25Single-Digit Nanometer Electron-Beam Lithography with an Aberration-Corrected Scanning Transmission Electron Microscope
Published on: September 14, 2018
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