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Updated: Mar 28, 2026

Scanning-probe Single-electron Capacitance Spectroscopy

Scanning-probe Single-electron Capacitance Spectroscopy

Published on: July 30, 2013

Scanning tunneling potentiometry implemented into a multi-tip setup by software.

F Lüpke¹, S Korte¹, V Cherepanov¹

¹Peter Grünberg Institut (PGI-3), Forschungszentrum Jülich, D-52425 Jülich, Germany.

The Review of Scientific Instruments

|January 3, 2016

Summary

We developed a new multi-tip scanning tunneling potentiometry technique for existing microscopes. This method enables high-resolution mapping of electric potential and topography on surfaces under ultra-high vacuum conditions.

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Area of Science:

Surface science
Scanning probe microscopy
Nanoscale electrical characterization

Background:

Existing multi-tip scanning tunneling microscopes (STM) lack integrated electrical potential measurement capabilities.
In situ electrical characterization under ultra-high vacuum (UHV) is crucial for understanding surface phenomena.

Purpose of the Study:

To introduce a novel multi-tip scanning tunneling potentiometry (STP) technique.
To enable flexible in situ contacting and simultaneous measurement of topography and local electric potential.
To demonstrate the technique's performance on well-defined surfaces.

Main Methods:

Implementation of STP into existing multi-tip STM setups without additional hardware.
In situ sample contacting under UHV conditions.
Measurement of sample topography and local electric potential with Ångström and microvolt resolution.

Main Results:

Successful thermovoltage measurements on Ag/Si(111)-(√3×√3)R30° surface, resolving a standing wave pattern.
Mapping of local transport fields resulting from lateral current on Ag/Si(111)-(√3×√3)R30° and Si(111)-(7×7) surfaces.

Conclusions:

The developed multi-tip STP technique is a versatile and hardware-efficient method for nanoscale electrical characterization.
The technique provides high spatial and potential resolution for studying surface electronic properties.
It opens new avenues for investigating transport phenomena on surfaces under UHV conditions.