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Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid
Published on: December 2, 2022
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Nanoscale rippling on polymer surfaces induced by AFM manipulation
Mario D'Acunto1, Franco Dinelli2, Pasqualantonio Pingue3
1Istituto Struttura della Materia, ISM-CNR, via Fosso del Cavaliere 100, 00133 Rome; Istituto di Scienza e Tecnologie dell'Informazione, ISTI-CNR, via Moruzzi, 1, 56124, Pisa, Italy.
Beilstein Journal of Nanotechnology
|January 7, 2016
Summary
Atomic force microscopy (AFM) can create nanoscale ripples on polymer films. This review explores methods like heating and solvent-assisted deformation for controlled nanorippling, aiming for technological applications.
Area of Science:
- Materials Science
- Nanotechnology
- Polymer Science
Background:
- Nanoscale rippling is an AFM-induced phenomenon observed across various materials.
- It has been extensively studied in polymer films due to controllable parameters.
- Recent advances include AFM cantilevers with integrated heaters.
Purpose of the Study:
- To review the current state of nanoscale rippling on polymer surfaces.
- To summarize methods for inducing and controlling nanorippling.
- To highlight the potential for technological applications.
Main Methods:
- Atomic Force Microscopy (AFM) scanning.
- Tip heating using integrated AFM cantilevers.
- Solvent-assisted viscoplastic deformation of polymer films.
Main Results:
- AFM-based procedures enable rapid, controlled nanoripple formation on polymers.
- Both thermal and solvent-assisted methods offer pathways to nanorippling.
- Despite progress, a complete theoretical understanding remains elusive.
Conclusions:
- Nanorippling on polymers is a promising phenomenon for nanoscale engineering.
- Further research is needed to fully elucidate the underlying mechanisms.
- Achieving precise control over nanorippling is key for future applications.

