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In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx
Published on: May 13, 2020
M A Zidan1, H Omran2, R Naous2
1Department of Electrical Engineering &Computer Science, University of Michigan, Ann Arbor, MI 48109, USA.
New adaptive-threshold techniques solve sneak-path issues in memristor crossbars. These methods reduce energy consumption and improve readout accuracy for future computing systems.
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