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Determination of unit cell
1Corporate Research Laboratories, Exxon Research and Engineering Company, Annandale, New Jersey 08801.
Journal of Electron Microscopy Technique
|September 1, 1989
Summary
Electron diffraction studies are enhanced by large angular views, aiding unit cell determination and phase identification. Convergent beam electron diffraction (CBED) offers detailed reciprocal lattice information for crystal structure analysis.
Area of Science:
- Materials Science
- Crystallography
- Electron Microscopy
Background:
- Electron diffraction is crucial for analyzing crystalline materials.
- Obtaining comprehensive diffraction data has been a challenge.
- Convergent beam electron diffraction (CBED) offers advanced capabilities.
Purpose of the Study:
- To detail the principles of analyzing electron diffraction patterns with large angular views.
- To demonstrate the application of CBED for unit cell determination and phase identification.
- To showcase the utility of higher-order Laue zones in crystal structure analysis.
Main Methods:
- Utilizing convergent beam electron diffraction (CBED) to obtain two-dimensional projections of the three-dimensional reciprocal lattice.
- Analyzing the spacing of reciprocal lattice layers parallel to the electron beam.
- Interpreting the distribution of reflections in zero, first, and higher-order Laue zones.
Main Results:
- CBED significantly enhances the ease and potential of electron diffraction studies.
- Information from higher-order Laue zones provides crucial data beyond the zero-layer pattern.
- The methods allow for the identification of submicron phases and determination of unit cells.
Conclusions:
- CBED is a powerful technique for detailed crystallographic analysis.
- The comprehensive data from CBED facilitates accurate crystal structure identification and determination.
- This approach is applicable to various commercial material systems.