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Updated: Mar 26, 2026

A Sample Preparation Pipeline for Microcrystals at the VMXm Beamline
Published on: June 17, 2021
On the scaling of multicrystal data sets collected at high-intensity X-ray and electron sources
Philip Coppens1, Bertrand Fournier1
1Chemistry Department, University at Buffalo, State University of New York , Buffalo, New York 14260-3000, USA.
Abstract:
The need for data-scaling has become increasingly evident as time-resolved pump-probe photocrystallography is rapidly developing at high intensity X-ray sources. Several aspects of the scaling of data sets collected at synchrotrons, XFELs (X-ray Free Electron Lasers) and high-intensity pulsed electron sources are discussed. They include laser-ON/laser-OFF data scaling, inter- and intra-data set scaling.
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