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Updated: Mar 26, 2026

Targeted Studies Using Serial Block Face and Focused Ion Beam Scan Electron Microscopy
Published on: August 10, 2019
1Sir William Dunn School of Pathology, South Parks Road, University of Oxford, Oxford, OX1 3RE, U.K.
Serial block face scanning electron microscopy (SBF-SEM) generates large 3D datasets, but data processing remains a significant challenge. This review explores methods and workflows for analyzing SBF-SEM data to enable reproducible research.
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