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Crosslinked Remote-Doped Hole-Extracting Contacts Enhance Stability under Accelerated Lifetime Testing in Perovskite

Jixian Xu1, Oleksandr Voznyy1, Riccardo Comin1

  • 1Department of Electrical and Computer Engineering, University of Toronto, 35 St George Street, Toronto, Ontario, M5S 1A4, Canada.

Advanced Materials (Deerfield Beach, Fla.)
|January 30, 2016
PubMed

Keywords:
electronic polymershole transport layershysteresisperovskitessolar cells

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