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Sample stage designed for force modulation microscopy using a tip-mounted AFM scanner.

Lu Lu¹, Song Xu², Donghui Zhang¹

¹Department of Chemistry, Louisiana State University, 232 Choppin Hall, Baton Rouge, LA 70803, USA. jgarno@lsu.edu.

|January 30, 2016

Summary

This summary is machine-generated.

A novel sample stage for force modulation microscopy (FMM) enables high-resolution mechanical property mapping of complex nanostructures. This accessory, designed for tip-mounted scanning probe microscopy (SPM) scanners, provides excellent resolution in ambient conditions.

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Area of Science:

Materials Science
Nanotechnology
Surface Science

Background:

Force Modulation Microscopy (FMM) is a Scanning Probe Microscopy (SPM) technique used for acquiring mechanical properties alongside topographic data.
FMM is particularly valuable for analyzing polymer and organic thin film samples, enabling high-resolution qualitative evaluation of mixed domains in copolymers or composite films.

Purpose of the Study:

To design and test a novel, generic sample stage accessory for FMM experiments.
To enable FMM measurements for SPM configurations utilizing a tip-mounted scanner.
To facilitate z-sample modulation for enhanced mechanical property analysis.

Main Methods:

A custom sample stage was constructed from machined polycarbonate, incorporating a piezoactuator for z-direction sample vibration.
The FMM sample stage was evaluated using test samples with nanoscale dimensions and increasingly complex surface morphologies, including nanoholes in organosilanes, mixed organosilanes on Si(111), and a cyclic gel polymer with nanostructures.
Frequency spectra were acquired for different sample domains to analyze local mechanical responses.

Main Results:

The home-constructed sample stage achieved excellent resolution in ambient conditions for complex and multi-component samples.
Distinct differences in local mechanical responses were revealed through frequency spectra analysis of various sample domains.
The stage proved effective for evaluating simple (two-domain) and complex (three-region) nanostructured surfaces.

Conclusions:

A practical and effective approach for constructing a sample stage accessory for z-sample modulation in FMM experiments with tip-mounted SPM scanners was demonstrated.
The developed stage facilitates high-resolution mechanical characterization of diverse nanostructured materials.
This accessory broadens the applicability of FMM for detailed analysis of material properties at the nanoscale.