Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Propagation of Uncertainty from Systematic Error01:10

Propagation of Uncertainty from Systematic Error

1.6K
The atomic mass of an element varies due to the relative ratio of its isotopes. A sample's relative proportion of oxygen isotopes influences its average atomic mass. For instance, if we were to measure the atomic mass of oxygen from a sample, the mass would be a weighted average of the isotopic masses of oxygen in that sample. Since a single sample is not likely to perfectly reflect the true atomic mass of oxygen for all the molecules of oxygen on Earth, the mass we obtain from this...
1.6K
Interference and Diffraction02:18

Interference and Diffraction

54.1K
Interference is a characteristic phenomenon exhibited by waves. When two electromagnetic waves interact with their peaks and troughs coinciding, a resulting wave with enhanced amplitude is produced. This is known as constructive interference. In this case, the two waves interacting are in phase with each other.
54.1K
Propagation of Uncertainty from Random Error00:59

Propagation of Uncertainty from Random Error

2.1K
An experiment often consists of more than a single step. In this case, measurements at each step give rise to uncertainty. Because the measurements occur in successive steps, the uncertainty in one step necessarily contributes to that in the subsequent step. As we perform statistical analysis on these types of experiments, we must learn to account for the propagation of uncertainty from one step to the next. The propagation of uncertainty depends on the type of arithmetic operation performed on...
2.1K
Distance Corrections01:15

Distance Corrections

364
To achieve precise distance measurements, especially in surveying and construction, certain corrections must be applied to account for potential sources of error like the standardization errors, temperature variations, and slope adjustments.Standardization error emerges when measurement equipment undergoes changes, such as wear, repairs, or weather impacts. To address this, surveyors compare the equipment’s readings to a standard. This process identifies any deviation that might lead to...
364
Calibration Curves: Correlation Coefficient01:10

Calibration Curves: Correlation Coefficient

5.5K
In a linear calibration curve, there is a value called the calibration coefficient, denoted by 'r,' which measures the strength and the direction of association between two variables. The correlation coefficient value ranges from −1 to +1. A value of +1 indicates a perfect positive linear correlation, −1 denotes a perfect negative correlation, and 0 implies no correlation between the two variables. A positive correlation value establishes that as one variable increases, the...
5.5K
Common Leveling Mistakes and Errors01:17

Common Leveling Mistakes and Errors

582
A survey team is tasked with determining the elevation difference between points Point A and Point B, separated by uneven terrain. They use a leveling instrument and a leveling rod.Common MistakesMisreading the Rod: During a backsight reading at Point A, the instrumentman observes the rod partially obscured by tall grass. Instead of reading 1.135 m, they mistakenly record 1.735 m due to the misalignment of the crosshair with the wrong graduation. This error adds 0.600 m to all subsequent...
582

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Single-shot high-aspect-ratio drilling of transparent dielectrics using an orthogonal dual-USPL configuration.

Optics letters·2026
Same author

VR-based automated suturing skill assessment in pediatric robotic surgery.

International journal of computer assisted radiology and surgery·2026
Same author

Association Between Plasma Neurofilament Light Concentration and Postoperative Delirium After Cardiac Surgery.

Journal of cardiothoracic and vascular anesthesia·2026
Same author

Absolute testing method for three optical flats using symmetric algorithms.

Optics express·2026
Same author

How do tumor-associated neutrophils regulate the microenvironmental landscape of brain tumors: Delivery of nano-particles through BBB.

PLoS computational biology·2026
Same author

Asthma-mediated control of optic glioma growth via T cell-microglia interactions: A mathematical model.

NPJ systems biology and applications·2026

Related Experiment Video

Updated: Mar 26, 2026

The Generation of Higher-order Laguerre-Gauss Optical Beams for High-precision Interferometry
12:14

The Generation of Higher-order Laguerre-Gauss Optical Beams for High-precision Interferometry

Published on: August 12, 2013

22.6K

Compensation for correlated error in multilayer interferometer.

Yangjin Kim, Kenichi Hibino, Naohiko Sugita

    Applied Optics
    |February 3, 2016
    PubMed
    Summary

    Windowed phase-shifting algorithms can improve surface shape measurements in multilayer interferometry. The 4N-3 algorithm minimizes correlated errors and offers the best repeatability for lithium niobate wafer analysis.

    More Related Videos

    Measurement of Quantum Interference in a Silicon Ring Resonator Photon Source
    12:19

    Measurement of Quantum Interference in a Silicon Ring Resonator Photon Source

    Published on: April 4, 2017

    8.9K
    Sample Drift Correction Following 4D Confocal Time-lapse Imaging
    10:04

    Sample Drift Correction Following 4D Confocal Time-lapse Imaging

    Published on: April 12, 2014

    17.1K

    Related Experiment Videos

    Last Updated: Mar 26, 2026

    The Generation of Higher-order Laguerre-Gauss Optical Beams for High-precision Interferometry
    12:14

    The Generation of Higher-order Laguerre-Gauss Optical Beams for High-precision Interferometry

    Published on: August 12, 2013

    22.6K
    Measurement of Quantum Interference in a Silicon Ring Resonator Photon Source
    12:19

    Measurement of Quantum Interference in a Silicon Ring Resonator Photon Source

    Published on: April 4, 2017

    8.9K
    Sample Drift Correction Following 4D Confocal Time-lapse Imaging
    10:04

    Sample Drift Correction Following 4D Confocal Time-lapse Imaging

    Published on: April 12, 2014

    17.1K

    Area of Science:

    • Optical metrology
    • Surface characterization
    • Interferometry

    Background:

    • Wavelength tuning interferometry estimates sample surface shape.
    • Multilayer structures like lithium niobate (LNB) wafers introduce correlated errors in phase calculations due to higher harmonics and phase-shift errors.

    Purpose of the Study:

    • To analyze correlated errors in windowed phase-shifting algorithms for multilayer interferometry.
    • To compare the performance of different algorithms in measuring LNB wafer surface shape and optical thickness variation.

    Main Methods:

    • Analysis of correlated errors using characteristic polynomial theory and Fourier representation of algorithms.
    • Simultaneous measurement of surface shape and optical thickness variation of LNB wafers using various windowed phase-shifting algorithms.

    Main Results:

    • The study evaluated different windowed phase-shifting algorithms for their effectiveness in multilayer interferometry.
    • The 4N-3 algorithm demonstrated superior performance with minimal repeatability error and reduced observed ripples.

    Conclusions:

    • The 4N-3 algorithm is identified as the optimal choice for precise surface shape and optical thickness measurements in multilayer interferometry.
    • This algorithm significantly reduces correlated errors, leading to improved measurement accuracy and repeatability for samples like LNB wafers.