IR Spectrometers
Determination of Crystal Structures
X-ray Crystallography
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Updated: Mar 26, 2026

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
This study introduces a novel Fourier spectral technology method to measure diffraction efficiency, overcoming limitations of traditional instruments. This new approach enhances accuracy and offers superior spectral resolution and luminous flux for grating measurements.
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