3D imaging by serial block face scanning electron microscopy for materials science using ultramicrotomy.

Area of Science:

• Materials Science
• Electron Microscopy
• Nanotechnology

Background:

• Mechanical serial block face scanning electron microscopy (SBFSEM) provides large-volume, high-resolution 3D electron images.
• It surpasses focused ion beam (FIB) serial sectioning in volume and X-ray computed tomography (CT) in resolution.
• SBFSEM enables precise characterization of microstructural features like shape, volume fraction, distribution, and connectivity.

Purpose of the Study:

• To outline the state-of-the-art in SBFSEM for engineering materials.
• To detail damage introduction during slicing and strategies for minimization.
• To focus on acquiring 3D images of metallic and coated systems.

Main Methods:

• Utilizing mechanical serial block face scanning electron microscopy (SBFSEM).
• Employing ultramicrotomy for nanoscale sectioning.
• Analyzing damage mechanisms and mitigation strategies during slicing.

Main Results:

• Demonstrated SBFSEM's capability for time and resource-efficient 3D imaging of engineering materials.
• Identified and addressed operational challenges and artifacts in SBFSEM for diverse materials.
• Acquired high-resolution 3D electron images for various metallic and coated systems.

Conclusions:

• SBFSEM is a powerful technique for detailed 3D microstructural analysis in materials science.
• Understanding and minimizing slicing-induced damage is crucial for wider application in engineering materials.
• The study provides practical insights for utilizing SBFSEM in metallic and coated systems.