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Transmission Electron Microscopy01:15

Transmission Electron Microscopy

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In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400...
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Electron Microscope Tomography and Single-particle Reconstruction01:07

Electron Microscope Tomography and Single-particle Reconstruction

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Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...
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X-ray Diffraction of Biological Samples01:10

X-ray Diffraction of Biological Samples

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X-ray diffraction or XRD is an analytical tool that utilizes X-rays to study ordered structures such as crystalline organic and inorganic samples, polycrystalline materials, proteins, carbohydrates, and drugs.
According to Bragg's law, when X-rays strike the sample positioned on a stage, the rays are  scattered by the electron clouds around the sample atoms. The  X-ray diffraction or scattering is caused by constructive interference of the X-ray waves that reflect off the internal...
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Scanning Electron Microscopy01:07

Scanning Electron Microscopy

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A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
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X-ray Crystallography02:18

X-ray Crystallography

26.8K
The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...
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Total Internal Reflection Fluorescence Microscopy01:05

Total Internal Reflection Fluorescence Microscopy

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Total internal reflection fluorescence microscopy or TIRF is an advanced microscopic technique used to visualize fluorophores in samples close to a solid surface with a higher refractive index, such as a glass coverslip. TIRF only allows fluorophores in proximity to the solid surface to be excited. When light from a medium with a lower refractive index (such as air) hits the glass coverslip at a critical angle, the light undergoes total internal reflection stead of passing through the glass.
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Related Experiment Video

Updated: Mar 26, 2026

Sample Preparation by 3D-Correlative Focused Ion Beam Milling for High-Resolution Cryo-Electron Tomography
08:20

Sample Preparation by 3D-Correlative Focused Ion Beam Milling for High-Resolution Cryo-Electron Tomography

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Highlighting material structure with transmission electron diffraction correlation coefficient maps.

Ákos K Kiss1, Edgar F Rauch2, János L Lábár3

  • 1Hungarian Academy of Sciences, Research Center for Energy Research, Institute for Technical Physics and Materials Science (MTA EK MFA), Konkoly Thege M. út 29-33, H-1121 Budapest, Hungary; Doctoral School of Molecular- and Nanotechnologies, Faculty of Information Technology, University of Pannonia, Egyetem u. 10., H-8200 Veszprém, Hungary.

Ultramicroscopy
|February 12, 2016
PubMed
Summary
This summary is machine-generated.

Transmission electron microscopy (TEM) generates correlation maps from diffraction patterns to reveal material defects. These maps effectively highlight grain boundaries, dislocations, and second-phase particles, aiding structural analysis.

Keywords:
Automated crystal orientation mapping (ACOM)Correlation coefficient mapElectron diffractionTransmission electron microscopy (TEM)

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Area of Science:

  • Materials Science
  • Solid State Physics
  • Electron Microscopy

Background:

  • Transmission electron microscopy (TEM) is crucial for nanoscale material characterization.
  • Analyzing diffraction patterns provides insights into crystal structures.
  • Identifying microstructural features like grain boundaries and dislocations is essential for understanding material properties.

Purpose of the Study:

  • To develop a method for visualizing material structural features using TEM.
  • To demonstrate the utility of correlation coefficient maps for defect analysis.
  • To enable direct deduction of interface inclination from contrast.

Main Methods:

  • Collecting diffraction patterns in scanning mode within a transmission electron microscope.
  • Computing differences between neighboring diffraction patterns to create correlation maps.
  • Analyzing the contrast in the resulting maps to identify structural features.

Main Results:

  • Correlation coefficient maps successfully highlight key material structural features.
  • Grain boundaries, second-phase particles, and dislocations are clearly visualized.
  • The inclination of internal crystal interfaces can be directly determined from the map contrast.

Conclusions:

  • Correlation coefficient mapping is an effective technique for microstructural analysis in TEM.
  • This method provides a direct link between map contrast and crystallographic information.
  • The technique offers a novel approach to characterizing defects and interfaces in materials.