Highlighting material structure with transmission electron diffraction correlation coefficient maps
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Updated: Mar 26, 2026

Sample Preparation by 3D-Correlative Focused Ion Beam Milling for High-Resolution Cryo-Electron Tomography
Published on: October 25, 2021
Ákos K Kiss1, Edgar F Rauch2, János L Lábár3
1Hungarian Academy of Sciences, Research Center for Energy Research, Institute for Technical Physics and Materials Science (MTA EK MFA), Konkoly Thege M. út 29-33, H-1121 Budapest, Hungary; Doctoral School of Molecular- and Nanotechnologies, Faculty of Information Technology, University of Pannonia, Egyetem u. 10., H-8200 Veszprém, Hungary.
Abstract:
Correlation coefficient maps are constructed by computing the differences between neighboring diffraction patterns collected in a transmission electron microscope in scanning mode. The maps are shown to highlight material structural features like grain boundaries, second phase particles or dislocations. The inclination of the inner crystal interfaces are directly deduced from the resulting contrast.
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