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Updated: Mar 25, 2026

Molecular Beam Mass Spectrometry With Tunable Vacuum Ultraviolet VUV Synchrotron Radiation
Published on: October 30, 2012
The ion microscope as a tool for quantitative measurements in the extreme ultraviolet
N Tsatrafyllis1,2, B Bergues3, H Schröder3
1Foundation for Research and Technology - Hellas, Institute of Electronic Structure &Laser, PO Box 1527, GR71110 Heraklion (Crete), Greece.
Abstract:
We demonstrate a tool for quantitative measurements in the extreme ultraviolet (EUV) spectral region measuring spatially resolved atomic ionization products at the focus of an EUV beam. The ionizing radiation is a comb of the 11(th)-15(th) harmonics of a Ti:Sapphire femtosecond laser beam produced in a Xenon gas jet. The spatial ion distribution at the focus of the harmonics is recorded using an ion microscope. Spatially resolved single- and two-photon ionization products of Argon and Helium are observed. From such ion distributions single- and two-photon generalized cross sections can be extracted by a self-calibrating method. The observation of spatially resolved two-EUV-photon ionization constitutes an initial step towards future single-shot temporal characterization of attosecond pulses.
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