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Updated: Mar 25, 2026

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
1University of South Carolina, Department of Mechanical Engineering, Columbia, SC, United States.
This study introduces a phased array beamforming method using guided waves for inspecting anisotropic composite plates. This technique enables rapid detection of surface defects in large composite structures.
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