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Updated: Mar 24, 2026

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
Published on: January 19, 2018
Investigation of pulsed mode operation with the frequency tuned CAPRICE ECRIS
F Maimone1, K Tinschert1, M Endermann1
1GSI Helmholtzzentrum für Schwerionenforschung GmbH, Planckstr. 1, 64291 Darmstadt, Germany.
Abstract:
In order to increase the intensity of the highly charged ions produced by the Electron Cyclotron Resonance Ion Sources (ECRISs), techniques like the frequency tuning and the afterglow mode have been developed and in this paper the effect on the ion production is shown for the first time when combining both techniques. Recent experimental results proved that the tuning of the operating frequency of the ECRIS is a promising technique to achieve higher ion currents of higher charge states. On the other hand, it is well known that the afterglow mode of the ECRIS operation can provide more intense pulsed ion beams in comparison with the continuous wave (cw) operation. These two techniques can be combined by pulsing the variable frequency signal driving the traveling wave tube amplifier which provides the high microwave power to the ECRIS. In order to analyze the effect of these two combined techniques on the ion source performance, several experiments were carried out on the pulsed frequency tuned CAPRICE (Compacte source A Plusiers Résonances Ionisantes Cyclotron Electroniques)-type ECRIS. Different waveforms and pulse lengths have been investigated under different settings of the ion source. The results of the pulsed mode have been compared with those of cw operation.
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