Ion beam production with sub-milligram samples of material from an ECR source for AMS

Current accelerator mass spectrometry experiments at the Argonne Tandem Linac Accelerator System facility at Argonne National Laboratory push us to improve the ion source performance with a large number of samples and a need to minimize cross contamination. These experiments can require the creation of ion beams from as little as a few micrograms of material. These low concentration samples push the limit of our current efficiency and stability capabilities of the electron cyclotron resonance ion source. A combination of laser ablation and sputtering techniques coupled with a newly modified multi-sample changer has been used to meet this demand. We will discuss performance, stability, and consumption rates as well as planned improvements.