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Updated: Aug 9, 2026

Quantification of Hydrogen Concentrations in Surface and Interface Layers and Bulk Materials through Depth Profiling with Nuclear Reaction Analysis
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Fine-tuning to minimize emittances of J-PARC RF-driven H⁻ ion source

A Ueno1, K Ohkoshi1, K Ikegami1

  • 1J-PARC Center, Tokai-Mura, Naka-Gun, Ibaraki-Ken 319-1195, Japan.

The Review of Scientific Instruments
|March 3, 2016
PubMed

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