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Updated: Jul 30, 2026

In Situ Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices
09:26

In Situ Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices

Published on: June 26, 2015

Off-normal and failure condition analysis of the MITICA negative-ion accelerator

Giuseppe Chitarin1, Piero Agostinetti1, Daniele Aprile1

  • 1Consorzio RFX, (CNR, ENEA, INFN, Università di Padova, Acciaierie Venete SpA), Corso Stati Uniti 4, 35127 Padova, Italy.

The Review of Scientific Instruments
|March 3, 2016
PubMed

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