Related Experiment Video
Updated: Mar 24, 2026

08:39
Shaping the Amplitude and Phase of Laser Beams by Using a Phase-only Spatial Light Modulator
Published on: January 28, 2019
10.5K
Prospects for electron beam aberration correction using sculpted phase masks.
Roy Shiloh1, Roei Remez1, Ady Arie1
1School of Electrical Engineering, Fleischman Faculty of Engineering, Tel Aviv University, Tel Aviv, Israel.
Ultramicroscopy
|March 4, 2016
Summary
A novel sculpted membrane acts as a phase-mask in transmission electron microscopes (TEM), enabling precise control over electron beam aberrations like astigmatism and spherical aberration.
Area of Science:
- Materials Science
- Physics
- Microscopy
Background:
- Electron microscopy has advanced significantly, yet current aberration-corrected microscopes remain limited.
- Existing state-of-the-art microscopes are expensive and occupy substantial space.
- There is a persistent gap between current capabilities and the theoretical electron diffraction limit.
Purpose of the Study:
- To demonstrate a cost-effective method for inducing specific aberrations in electron beams.
- To utilize a sculpted membrane as a phase-mask for aberration control.
- To enhance the functionality of standard high-resolution transmission electron microscopes (TEM).
Main Methods:
- Fabrication of a thin, sculpted membrane to act as an electron beam phase-mask.
- Integration of the phase-mask into a standard high-resolution transmission electron microscope (TEM).
- Experimental characterization of induced beam aberrations.
Main Results:
- Successfully induced beam splitting using the sculpted membrane.
- Experimentally demonstrated control over two-fold and three-fold astigmatism.
- Verified the induction of spherical aberration in the electron beam probe.
- Showcased the membrane's effectiveness as a phase-mask in a standard TEM.
Conclusions:
- A sculpted membrane phase-mask offers a viable and economical approach to controlling electron beam aberrations.
- This technique can enhance the capabilities of existing transmission electron microscopes (TEM).
- The method provides a pathway to overcome limitations in current electron microscopy technology.

