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Centroid precision and orientation precision of planar localization microscopy
C McGray1,2, C R Copeland3,4, S M Stavis3
1Engineering Physics Division, NIST, Gaithersburg, Maryland, U.S.A.
Journal of Microscopy
|March 13, 2016
Summary
Localization microscopy precision is extended to rigid bodies, defining centroid and orientation precision. These new metrics quantify uncertainty in microscopic motion analysis for super-resolution imaging and particle tracking.
Area of Science:
- Optical Microscopy
- Nanotechnology
- Metrology
Background:
- Localization microscopy is crucial for super-resolution imaging and particle tracking.
- Existing precision concepts are limited to optical point sources.
Purpose of the Study:
- Extend localization precision to microscopic rigid bodies.
- Develop measurement functions for planar pose and motion analysis.
- Derive analytical lower bounds for centroid and orientation precision.
Main Methods:
- Formal extension of localization precision concept.
- Development of measurement functions for pose and motion.
- Analytical derivation of centroid and orientation precision.
- Monte Carlo simulations for numerical validation.
Main Results:
- Introduced centroid precision and orientation precision for rigid bodies.
- Derived analytical expressions for uncertainty bounds.
- Validated theoretical bounds numerically.
- Demonstrated experimental utility with a microelectromechanical goniometer.
Conclusions:
- Centroid and orientation precision offer generalizable metrics for microscopic motion.
- These concepts are valuable for super-resolution imaging and particle tracking applications.
- The derived expressions provide physical lower bounds on measurement uncertainty.
