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Inductively coupled plasma (ICP) is the most widely used plasma source in atomic emission spectroscopy (AES), also known as Inductively Coupled Plasma Optical Emission Spectroscopy (ICP-OES). The ICP source, or torch, consists of three concentric quartz tubes with argon gas flowing through them. A spark from a Tesla coil initiates the ionization of argon, generating a high-temperature plasma.
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AES is a powerful analytical technique, especially effective when used with plasma sources, producing abundant spectra in characteristic emission lines. The Inductively Coupled Plasma (ICP), in particular, yields superior quantitative analytical data due to its high stability, low noise, low background, and minimal interferences under optimal experimental conditions. However, newer air-operated microwave sources are emerging as promising alternatives that could be more cost-effective than...
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The instrumentation of atomic emission spectrometry (AES) involves various components, including atomization devices that convert samples into gas-phase atoms and ions. There are two main types of atomization devices: continuous and discrete atomizers.  Continuous atomizers, like plasmas and flames, introduce samples in a constant stream, while discrete atomizers inject individual samples using syringes or autosamplers. The most common discrete atomizer is the electrothermal atomizer.
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Inductively coupled plasma (ICP) is the common plasma source used in atomic emission spectroscopy (AES), a technique that detects and analyzes various elements in a sample. This method is often called inductively coupled plasma atomic emission spectroscopy (ICP-AES).
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Towards universal ambient ionization: direct elemental analysis of solid substrates using microwave plasma

K M Evans-Nguyen1, J Gerling, H Brown

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Direct ambient ionization mass spectrometry using microwave plasma rapidly analyzes solid samples for atomic and molecular composition. This fieldable technology enables rapid, on-site forensic screening without sample preparation.

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Area of Science:

  • Analytical Chemistry
  • Mass Spectrometry
  • Plasma Physics

Background:

  • Traditional mass spectrometry often requires extensive sample preparation, limiting rapid analysis.
  • Ambient ionization techniques offer potential for faster, on-site measurements.
  • Microwave plasma sources have shown promise for atomic emission and ionization.

Purpose of the Study:

  • To develop and characterize a microwave plasma system for direct ambient ionization mass spectrometry of solid substrates.
  • To achieve simultaneous atomic and molecular spectral analysis without sample pre-treatment.
  • To demonstrate the feasibility of this technology for forensic applications.

Main Methods:

  • Utilized a microwave plasma torch (MPT) configuration coupled to an ion trap mass spectrometer.
  • Optimized microwave plasma parameters for ambient ionization.
  • Analyzed various solid forensic samples, including explosive/radionuclide and gunshot residue mixtures.

Main Results:

  • Successfully obtained rapid atomic spectra directly from solid samples, eliminating the need for digestion.
  • Simultaneously acquired molecular spectra for organic components in an ambient ionization format.
  • Demonstrated accurate determination of atomic and organic composition for complex forensic samples.

Conclusions:

  • Microwave plasma direct ambient ionization mass spectrometry is a viable technique for rapid, on-site analysis of solid samples.
  • The developed multimode ion source is fieldable and can be coupled with portable mass spectrometers.
  • This technology holds significant potential for nuclear and conventional forensic screening.