Label-noise resistant logistic regression for functional data classification with an application to Alzheimer's

Seokho Lee1, Hyejin Shin2, Sang Han Lee3

  • 1Department of Statistics, Hankuk University of Foreign Studies, Yongin, Gyeonggi, Korea.

Biometrics
|March 19, 2016
PubMed
Summary

This study introduces a robust logistic regression model to improve Alzheimer's disease (AD) diagnosis by analyzing corpus callosum (CC) thickness from MRI scans, effectively handling mislabeled data for better classification accuracy.