Significance of Displacement Current
Displacement Current
Carrier Transport
Drift Velocity
Non-ohmic Devices
Biasing of Metal-Semiconductor Junctions
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Using Laser Scanning Microscopy to Determine Electromigration in Molybdenum Disilicide
Published on: May 23, 2025
D Marian1,2, N Zanghì1, X Oriols2
1Dipartimento di Fisica dell'Università di Genova and INFN sezione di Genova, Via Dodecaneso 33, 16146 Genova, Italy.
This study introduces a novel method for measuring electron momentum and position using weak values in electronic devices. The technique leverages displacement current measurements, offering new possibilities for quantum electronics and fundamental physics research.
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