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Performance Assessment of a New Variable Stiffness Probing System for Micro-CMMs
Khalid Alblalaihid1, Peter Kinnell2, Simon Lawes3
1Manufacturing Metrology Team, Advanced Manufacturing Metrology Research Group, Faculty of Engineering, The University of Nottingham, Nottingham NG7 2RD, UK. eaxksa@nottingham.ac.uk.
Sensors (Basel, Switzerland)
|April 13, 2016
Summary
This study introduces a novel micro-scale tactile probe with active suspension, enabling adjustable stiffness for precise measurements. This innovation overcomes design trade-offs, enhancing performance in micro-scale applications.
Area of Science:
- Micro-scale metrology
- Mechanical engineering
- Sensor technology
Background:
- Designing micro-scale tactile probes requires balancing stiffness and flexibility.
- Probes need to be flexible to prevent damage but stiff enough to overcome surface forces.
- Existing probes face limitations in adapting to varying measurement demands.
Purpose of the Study:
- To develop a micro-scale tactile probe with actively controlled, variable stiffness.
- To address the design trade-off between probe flexibility and stiffness.
- To enhance precision and reliability in micro-scale tactile measurements.
Main Methods:
- Implementation of a novel active suspension structure within the micro-scale probe.
- Development of a control system to modulate and switch between two distinct probe stiffness values (stiff and flexible).
- Characterization of stylus tip displacement and measurement uncertainty during stiffness transitions.
Main Results:
- The active suspension system successfully modulated probe stiffness.
- A consistent flexible mode tip deflection within 12 nm (vertical axis) was achieved.
- The system demonstrated an overall uncertainty of 58 nm for 3D displacement measurements.
Conclusions:
- The developed variable stiffness micro-scale probe system offers significant potential for advanced metrology.
- Active stiffness modulation overcomes traditional design limitations in micro-tactile sensing.
- This technology enables more sensitive and robust micro-scale measurements.
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