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Related Experiment Video

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Obtaining 3D Chemical Maps by Energy Filtered Transmission Electron Microscopy Tomography
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A filtering method to reveal crystalline patterns from atom probe microscopy desorption maps.

Lan Yao1

  • 1Department of Materials Science and Engineering, University of Michigan, Ann Arbor, MI 48109, United States.

Methodsx
|April 23, 2016
PubMed
Summary

This study introduces a new filtering method for Atom Probe Microscopy (APM) data. The technique enhances the visualization of crystallographic information in materials like aluminum and iron-chromium alloys.

Keywords:
A filtering method to reveal crystalline patterns from atom probe microscopy desorption mapsAtom probe microscopy

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Area of Science:

  • Materials Science
  • Analytical Chemistry
  • Physics

Background:

  • Atom Probe Microscopy (APM) is a powerful technique for atomic-scale material analysis.
  • Extracting detailed crystallographic information from APM data can be challenging due to data complexity.

Purpose of the Study:

  • To develop and demonstrate a novel filtering method for APM data.
  • To improve the identification and analysis of crystallographic features within APM datasets.

Main Methods:

  • A filtering approach based on the time difference between successive atomic evaporations.
  • Correlation of evaporation time differences with atomic location and local surface structure.
  • Application of the method to pure aluminum and Fe-15at.% Cr alloy datasets.

Main Results:

  • The filtering method successfully revealed clear crystallographic poles in pure aluminum specimens.
  • Crystallographic patterns, less apparent in raw data, were significantly enhanced in Fe-15at.% Cr datasets.
  • The method demonstrates effectiveness in uncovering hidden crystallographic information.

Conclusions:

  • The developed filtering method is effective for extracting crystallographic information from APM data.
  • This technique enhances the analysis of materials with complex or subtle crystallographic features.
  • The method provides a valuable tool for materials characterization using APM.