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Measurements of Strain

Measurements of Strain

Strain quantifies the deformation of a material under force, typically measured as normal strain, which represents the change in length when compared with the original length. Electrical strain gauges are used for enhanced accuracy. These devices consist of a conductive wire mounted on a paper backing that adheres to the material's surface. These gauges operate on the piezoresistive effect, where the wire's electrical resistance changes in response to mechanical deformation. The strain...

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Updated: Mar 22, 2026

Production of a Strain-Measuring Device with an Improved 3D Printer

Production of a Strain-Measuring Device with an Improved 3D Printer

Published on: January 30, 2020

Pump-probe spectrometer for measuring x-ray induced strain.

A Loether, B W Adams, A DiCharia

|April 30, 2016

Summary

This summary is machine-generated.

A new hard x-ray spectrometer uses a multi-crystal Bragg reflector to generate pump and probe pulses from a single x-ray source. This technique directly measures x-ray induced crystalline lattice strain.

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Last Updated: Mar 22, 2026

Production of a Strain-Measuring Device with an Improved 3D Printer

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Published on: January 30, 2020

$Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples$

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Published on: June 19, 2018

Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes

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Published on: May 23, 2017

Area of Science:

Materials Science
Condensed Matter Physics
Spectroscopy

Background:

Advanced spectroscopic techniques are crucial for understanding material dynamics.
X-ray based methods offer unique insights into electronic and structural properties.

Purpose of the Study:

To demonstrate a novel hard x-ray pump-probe spectrometer.
To enable direct measurement of x-ray induced crystalline lattice strain.

Main Methods:

Utilized a multi-crystal Bragg reflector at a third-generation synchrotron source.
Generated broadband pump and monochromatic probe pulses from a single intense x-ray pulse (8.767 keV).

Main Results:

Successfully demonstrated a functional hard x-ray pump-probe spectrometer.
Proof-of-concept experiment directly measured x-ray induced crystalline lattice strain.

Conclusions:

The developed spectrometer is a viable tool for studying ultrafast material dynamics.
This technique advances the capability to probe lattice strain induced by x-rays.