Related Experiment Video
Updated: Mar 22, 2026
06:17
Production of a Strain-Measuring Device with an Improved 3D Printer
Published on: January 30, 2020
6.5K
Pump-probe spectrometer for measuring x-ray induced strain
Optics Letters
|April 30, 2016
Summary
A new hard x-ray spectrometer uses a multi-crystal Bragg reflector to generate pump and probe pulses from a single x-ray source. This technique directly measures x-ray induced crystalline lattice strain.
Area of Science:
- Materials Science
- Condensed Matter Physics
- Spectroscopy
Background:
- Advanced spectroscopic techniques are crucial for understanding material dynamics.
- X-ray based methods offer unique insights into electronic and structural properties.
Purpose of the Study:
- To demonstrate a novel hard x-ray pump-probe spectrometer.
- To enable direct measurement of x-ray induced crystalline lattice strain.
Main Methods:
- Utilized a multi-crystal Bragg reflector at a third-generation synchrotron source.
- Generated broadband pump and monochromatic probe pulses from a single intense x-ray pulse (8.767 keV).
Main Results:
- Successfully demonstrated a functional hard x-ray pump-probe spectrometer.
- Proof-of-concept experiment directly measured x-ray induced crystalline lattice strain.
Conclusions:
- The developed spectrometer is a viable tool for studying ultrafast material dynamics.
- This technique advances the capability to probe lattice strain induced by x-rays.
