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High-bandwidth uni-traveling carrier waveguide photodetector on an InP-membrane-on-silicon platform.
Optics Express
|May 4, 2016
Summary
A novel silicon-integrated photodetector achieves over 67 GHz bandwidth and 54 Gb/s data rates. This advancement enables high-speed optical communication on a silicon photonic platform.
Area of Science:
- Photonics
- Materials Science
- Electrical Engineering
Background:
- Silicon photonics offers a scalable platform for integrated optical circuits.
- High-speed photodetectors are crucial components for optical communication systems.
- Integrating III-V materials like InP with silicon enables advanced photonic functionalities.
Purpose of the Study:
- To demonstrate a uni-traveling carrier photodetector (UTC-PD) heterogeneously integrated on silicon.
- To achieve ultra-high bandwidth and high responsivity in the integrated photodetector.
- To validate the performance for high-speed data transmission applications.
Main Methods:
- Fabrication of an InP-based photonic membrane on a silicon wafer.
- Utilizing a novel double-sided processing technique for integration.
- Characterization of the photodetector's 3 dB bandwidth, responsivity, and eye diagrams.
Main Results:
- Achieved a 3 dB bandwidth exceeding 67 GHz.
- Obtained a responsivity of 0.7 A/W at 1.55 μm wavelength.
- Demonstrated open eye diagrams at a data rate of 54 Gb/s.
Conclusions:
- The demonstrated UTC-PD showcases excellent high-speed performance.
- Heterogeneous integration on silicon provides a promising pathway for advanced photonic platforms.
- This technology holds potential for future high-speed optical communication and data processing applications.

